Academics

Faculty

Dr. Prasad Vivek Joglekar
Assistant Professor
Dr. Prasad Vivek Joglekar

Bio

Prasad Joglekar has over 15 years of experience in research (characterization), teaching, and lab management, demonstrating extensive knowledge in various fields. He specializes in surface analysis of single crystal metals using Synchrotron Radiation (high flux photon beam) and positron beam spectroscopy. He also has expertise in ultra high vacuum techniques, thin film deposition (evaporation, CVD passivation, sputtering), and qualitative, quantitative analysis, and imaging of a wide range of samples using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).

Research Areas

Surface Physics, Spectroscopy, Magnetic Materials and Thin films, Fiber Optics, 2D Materials

Publications

1. V. A Chirayat, R. Gladen, A. MacDonald, A Fairchild, P.V. Joglekar, A. H. Weiss et.al. “A multi- stop time-of-flight spectrometer for the measurement of positron annihilation induced electrons in coincidence with the Doppler-shifted annihilation gamma photon.” Rev. Sci. Instrum. 91, 033903 (2020); https://doi.org/10.1063/1.5140789

2. P V Joglekar, R Gladen, V.A.Chirayat, A.J.Fairchaild, S Kalaskar, K Shastry, Z. Lim, Q. Dong, S.L. Hulbert, R. A. Bartynksi, Wolfgang S. M Werner and A.H.Weiss “Measurement of the full electron spectrum associated with the Ag N3VV Auger transitions: Evidence for the contribution of multi-electron Auger processes”. Journal of electron spectroscopy and related phenomenon, 235 (2019) 16-22, June 2019.

3. S Mukherjee, K Shastry, C.V Anto, P V Joglekar, M.P. Nadesalingam, Shuping Xie, Neng Jiang, and A. Weiss. "Magnetic Bottle TOF Spectrometer for Background-free Positron Annihilation Induced Auger Electron Spectroscopy". Review of Sci. instruments 87, 035114 (2016)

4. S Satyal, P Joglekar, S Kalaskar, K Shastry, S Hulbert, A Weiss. “Measurement of the background in Auger photoemission coincidence spectra (APECS) associated with multi electron and inelastic valence band photoemission processes” - Journal of electron spectroscopy and related phenomenon, 195 (2014) 66-70, May 2014

Google Scholar link :https://scholar.google.com/citations?hl=en&user=HDy8nnIAAAAJ

ORCID link :https://orcid.org/0000-0001-9363-1781

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